|
Item
|
Category
|
Abbv
|
Ref. JESD47
|
Ref. AEC Q100
|
|
ESD11111
|
Electrostatic Discharge - Human Body Model
|
HBM
|
JS-001
JESD22-A114
|
AEC Q100-002
|
|
Electrostatic Discharge - Charged Device Model
|
CDM
|
JS-002
|
AEC Q100-011
|
|
Latch-Up
|
|
LU
|
JESD78
|
AEC Q100-004
|
|
|
|
|
|
|
|
Reliability
|
Pre-condition - MSL3
|
PC
|
JESD22-A113
J-STD-020
|
JESD22-A113
J-STD-020
|
|
High Temperature Storage
|
HTSL
|
JESD22-A103
JESD22-A113
|
JESD22-A103
|
|
Temperature Cycling
|
TC
|
JESD22-A104
|
JESD22-A104
|
|
Unbiased Temperature / Humidity - Unbiased HAST
|
UHAST
|
JESD22-A118
|
JESD22-A118
|
|
Unbiased Temperature / Humidity - Autoclave
|
AC
|
JESD22-102
|
JESD22-102
|
|
Unbiased Temperature Humidity
|
TH
|
JESD22-A101
|
JESD22-A101
|
|
Solderability
|
SD
|
MIL-STD-883 M2003
J-STD-002
|
J-STD-002
|
|
Tin Whisker Acceptance / Lead (Pb) Free
|
WSR / LF
|
JESD22-A121 through rqmts of JESD201
|
AEC Q005
|
|
Lead Integrity
|
LI
|
JESD22-B105
|
JESD22-B105
|
|
Temperature Humidity bias (standard 85/85)
|
THB
|
JESD22-A101
|
JESD22-A101
|
|
Temperature,Humidity Bias
( Highly Accelerated Temperature and Humidity Stress)
|
HAST
|
JESD22-A110
|
JESD22-A110
|
|
High Temperature Operating Life
|
HTOL
|
JESD22-A108
JESD85
|
JESD22-A108
|
|
Early Life Failure Rate
|
ELFR
|
JESD22-A108
JESD74
|
AEC-Q100-008
|